November 03 (Friday)
마이크로/나노공학부문 포스터
Poster,
3층 로비,
09:50~10:40
  • Chair :
  •  옥종걸(서울과기대), 장원석(기계연), 강현욱(전남대), 심형철(기계연)
Fr16A-39
09:50~10:40

Design of patch clamp amplifier for scanning ion conductance microscopy

장승현, 이상헌(안동대학교기계설계공학과)
Scanning ion conductance microscopy (SICM) has been developed to image a smooth surface such as an active membrane of living cell that can be deformed or broken by the probe of microscope and also image a microstructure that floats inside the liquid.
However, the SICM have limits which the low response time due to the high time constant generated by the electrode and the pipette used as the ion sensor. In addition, because of specimens must be placed in aqueous solution, the imaging of specimens in air is impossible with SICM.
Therefore, to compensate the disadvantages of SICM resulted from the structural characteristics of SICM and to integrate with conventional atomic force microscope to cope with various kinds of specimens, we designed and fabricated the fundamental elements of the SICM including patch clamp amplifier. We also checked the output characteristics of the SICM and propose ways to get a stable signal output.
Keywords : patch clamp amplifier(패치 클램프 증폭기), scanning ion conductance microscope(주사형 이온 전도 현미경)
Paper : Fr16A-39.pdf

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