Session Track
November 03 (Friday)
CAE 및 응용역학부문 포스터
Poster,
3층 로비,
14:10~15:00
- 강건욱(연세대), 강남우(KAIST), 김남근(인천대), 손동우(한국해양대)
Fr16C-51
14:10~15:00
환경 내 나노 독성 물질에 대한 고민감 검출 방법들
Over the past two decades, the field of sensing has advanced to include a wide range of methods and devices for chemical, biological and environmental toxicity detection. The monitoring of toxic ions is important for environment and health as well as for fundamental research. As needs of high sensitivity toxic ion sensors are rising the interest in overcoming methods are high, thus we have demonstrated not only high-sensitivity detection of Ag+ using the SSNO with the sandwich assay but also a novel approach based on KPFM imaging and measurement for ultra-sensitivity detection of nano-toxic silver ion using a single droplet of analytical solution. In the long run, it is implied that the resonant oscillator may enable not only the label-free detection of environmental toxic materials, shedding the light on the coordination chemistry, but also fiducial point of quality of water.
Keywords : Kelvin probe force microscopy(표면전하현미경), Atomic force microscopy(원자력현미경), Toxicant(독성물질), High sensitive detection(고민감도 검출), Nano(나노), Silver ion(은 이온), Cantilever(캔틸레버), Heavy metal ion(중금속 이온)
Paper : Fr16C-51.pdf
(사)대한기계학회, 서울시 강남구 테헤란로 7길 22 한국과학기술회관 신관 702호, Tel: (02)501-3646~3648, E-mail: ksme@ksme.or.kr