Session Track
November 01 (Wednesday)
일반기계 및 부품 신뢰성(II)
Oral,
제11발표장(304호),
15:50~16:50
- 김선진(부경대)
We11C-4
15:50~16:50
전자소자 측정용 프로브의 마모 특성에 관한 연구
High productivity is one of the most important factors for the success of electronic device and components industries. The test process which measures and sorts components is also getting faster to reduce the manufacturing cycle time. Particularly, the wear resistance of the test probes is strongly required to achieve short cycle time. In this work, the frictional and wear behavior of the test probe for electronic components was investigated. FEA simulation was also conducted for understanding of wear mechanism and improved design.
Keywords : Tribology(트라이볼로지), Test probe(측정 프로브), Electronic component(전자부품), FEA(유한요소법)
Paper : We11C-4.pdf
(사)대한기계학회, 서울시 강남구 테헤란로 7길 22 한국과학기술회관 신관 702호, Tel: (02)501-3646~3648, E-mail: ksme@ksme.or.kr