November 01 (Wednesday)
열 및 물질전달(II)
Oral,
제3발표장(202A호),
15:50~16:50
  • Chair :
  •  김현정(아주대)
We03C-4
15:50~16:50
금속-수지 이중층 구조에서의 광열편향법을 이용한 금속 두께 측정에 대한 수치해석적 연구
이희진, 유재석, 김무중, 김관택, 김현정(아주대학교)
In this study, the thickness for first layer of metal-resin double layer materials is measured using photothermal deflection method. While the modulated pump beam is irradiating on material, the periodic temperature distribution changes occur in the material due to photothermal effect. The periodic temperature distribution depends on the effective thermal diffusion coefficient in the range of thermal wave influence inside the material. According to the thickness for first layer, the effective thermal diffusion coefficient will be changed, which results in phase change of probe beam. Based on these phenomena, the profiles of phase change according to the various thickness for first layer for five-step of frequency were obtained using numerical analysis. Also, numerical results were non-dimensionalized. It can be identified that the phase profiles have the same tendency regardless of frequency changes if the dimensional parameter is identical. As a result, the thickness for first layer can be determined by the frequency of pump beam and the phase delay of probe beam.
Keywords : Photothermal Spectroscopy(광열분광법), Depth Measurement(깊이 측정), Double Layer(이중층), Photothermal Effect(광열효과), Mirage Method(편향법), Imaging Method(이미징 기법)
Paper : We03C-4.pdf

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